A non-destructive microscopic technology suitable for in-depth study of materials that may not be seen via SEM and AFM. XRM provides opportunities for material characterization, observation of fracture mechanics, investigation of properties at multiple length-scales. Excellent instrument to study additive manufactured (AM) specimens, dissimilar welded metals and alloys, and in situ tensile and compressional studies.  

Specifications

•X-ray Source

  Type  Sealed transmission

  Tube Voltage Range   30 – 160 kV 

  Maximum Output   10 W

  Radiation Safety   < 1 μS/hr (equivalent to 0.10 mRem/hr)

•Detector System 

  Standard Objectives   0.4X, 4X, 20X coupled with optimized scintillators for highest   absorption contrast

•Imaging

  Spatial resolution  -0.7 μm

  Minimum achievable Voxel    70 nm

•Stages

  Sample Stage (load capacity)   25 kg

  Sample Stage Travel (x, y, z)   45, 100, 50 mm

  Stage Travel (rotation)   360º

  Source Travel (z)   190 mm

  Detector Travel (z)   290 mm

  Sample Size Limit   300 mm

•Integrated in situ recipe control for Deben stages

•Acquisition software: Scout-and-Scan Control System

•Reconstruction software: XMReconstructor

•Viewer software: XM3DViewe